SciELO - Scientific Electronic Library Online

 
vol.54 número3Alturas de equilibrio de líquidos en celdas de Hele-Shaw corrugadas bajo penetración capilar espontáneaAbsolute values of transport mean free path of light in non-absorbing media using transmission and reflectance measurements índice de autoresíndice de materiabúsqueda de artículos
Home Pagelista alfabética de revistas  

Servicios Personalizados

Revista

Articulo

Indicadores

Links relacionados

  • No hay artículos similaresSimilares en SciELO

Compartir


Revista mexicana de física

versión impresa ISSN 0035-001X

Resumen

PEREZ RUIZ, S.J et al. Optical sensing technique for Young's modulus measurements in piezoelectric materials. Rev. mex. fis. [online]. 2008, vol.54, n.3, pp.253-256. ISSN 0035-001X.

In the design of microsensors using microelectromechanical system (MEMS) technology, it is necessary to know the elastic properties of the materials employed in their fabrication. Reliable mechanical properties of the materials are critical to the safety and correct functioning of these microdevices. Mechanical testing of microstructures that are only a few microns thick requires novel techniques and specialized procedures for preparation and handling. In this paper a simplified optic sensing is used to measure the Young's modulus in piezoelectric cantilever. This optical technique was chosen because it is the most appropriate when working with small devices, besides being easily implemented and low cost.

Palabras llave : Young's Modulus; piezoelectric cantilever.

        · resumen en Español     · texto en Inglés     · Inglés ( pdf )

 

Creative Commons License Todo el contenido de esta revista, excepto dónde está identificado, está bajo una Licencia Creative Commons